Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy

被引：9

作者：

Flink, A. ^{[1
]}

M'Saoubi, R. ^{[2
]}

Giuliani, F. ^{[1
]}

Sjolen, J. ^{[2
]}

Larsson, T. ^{[2
]}

Persson, P. O. A. ^{[1
]}

Johansson, M. P. ^{[2
]}

Hultman, L. ^{[1
]}

机构：

[1] Linkoping Univ, IFM, Dept Phys Chem & Biol, Thin Film Phys Div, S-58183 Linkoping, Sweden

[2] Seco Tools AB, S-73782 Fagersta, Sweden

来源：

WEAR | 2009年 / 266卷 / 11-12期

基金：

英国工程与自然科学研究理事会;

关键词：

Cutting tool; TiSiN; TEM; FIB; Microstructure; Hard coating; PCBN;

D O I：

10.1016/j.wear.2009.03.001

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

A method based on focused ion beam milling and analytical electron microscopy to investigate the nature of the tool-chip interface is presented. It is employed to study tool-chip interfaces of the rake face of a (Ti0.83Si0.17)N coated PCBN insert after turning of case-hardened steel. Analytical electron microscopy shows the presence of a smeared adhered layer on the coating, which consists of steel elements from the work-piece, oxygen, and Si and N, most likely originating from the coating. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：1237 / 1240

页数：4

共 13 条

[1]

Barna A., 1991, Mat. Tes. Soc. Symp. Proc, V254, P3

[2]

Coelho RT, 2006, IND DIAMOND REV, P60

[3] Wear mechanismes of new tool materials for Ti-6Al-4V high performance machining [J].

Corduan, N ;

Himbert, T ;

Poulachon, G ;

Dessoly, M ;

Lambertin, M ;

Vigneau, J ;

Payoux, B .

CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2003, 52 (01) :73-76

[4]

FLINK A, J MAT RES IN PRESS

[5] Tribology of tool-chip interface and tool wear mechanisms [J].

Gekonde, HO ;

Subramanian, SV .

SURFACE & COATINGS TECHNOLOGY, 2002, 149 (2-3) :151-160

[6] EELS studies of Ti-bearing materials and ab initio calculations [J].

Kihn, Y ;

Mirguet, C ;

Calmels, L .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2005, 143 (2-3) :117-127

[7] Preparation of transmission electron microscopy cross-section specimens using focused ion beam milling [J].

Langford, RM ;

Petford-Long, AK .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2001, 19 (05) :2186-2193

[8] Structure and composition of built-up layers on coated tools during turning of Ca-treated steel [J].

Larsson, A ;

Ruppi, S .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2001, 313 (1-2) :160-169

[9] Deformation under nanoindents in sapphire, spinel and magnesia examined using transmission electron microscopy [J].

Lloyd, SJ ;

Molina-Aldareguia, JM ;

Clegg, WJ .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 2002, 82 (10) :1963-1969

[10] Innovative methods for the investigation of tool-chip adhesion and layer formation during machining [J].

M'Saoubi, R ;

Chandrasekaran, H .

CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2005, 54 (01) :59-62

← 1 2 →