共 17 条
[3]
Goodwin JF., 1965, CHEM TECHN SYUMP, V315, P20
[4]
Govindaraju K., 1994, GEOSTANDARDS NEWSLET, VXVIII
[5]
GUNTHER D, 1995, CAN J APPL SPECTROSC, V40, P111
[6]
Ultra-trace element analysis of NIST SRM 616 and 614 using laser ablation microprobe inductively coupled plasma mass spectrometry (LAM-ICP-MS): a comparison with secondary ion mass spectrometry (SIMS)
[J].
GEOSTANDARDS NEWSLETTER-THE JOURNAL OF GEOSTANDARDS AND GEOANALYSIS,
1997, 21 (02)
:191-203
[7]
HORN I, 1995, THESIS G AUGUST U GO
[8]
HORN I, 1999, IN PRESS CHEM GEOLOG
[9]
JACKSON SE, 1992, CAN MINERAL, V30, P1049
[10]
TRACE-ELEMENT ANALYSIS OF GEOLOGICAL SURVEY OF JAPAN SILICATE REFERENCE MATERIALS - COMPARISON OF SSMS WITH ICP-MS DATA AND A CRITICAL DISCUSSION OF COMPILED VALUES
[J].
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY,
1994, 350 (4-5)
:310-318