Microsecond Intermittent Fault Detection for Wire and Connector Defect Prognostics

被引:0
|
作者
Auzanneau, Fabrice [1 ]
Layer, Christophe [1 ]
机构
[1] CEA, LIST, Dept Architectures Concept & Logiciel Embarque, Nanoinnov, Bat 862-PC172, F-91191 Gif Sur Yvette, France
来源
2017 IEEE SENSORS | 2017年
关键词
Wire diagnosis; reflectometry; chaos; CTDR; intermittent fault; prognostics;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Wire fault detection has been identified as a crucial need for aircraft safety. Several accidents were reportedly caused by intermittent faults such as arcs, encouraging studies on their detection. Detecting intermittent defects is only possible if the detection device is embedded within or close to the harness and it requires a very fast and efficient method, robust to noise. The recently presented Chaos Time Domain Reflectometry (CTDR) method has shown high robustness to noise and the capacity of monitoring power as well as communication wires without interfering with existing signals. This paper shows that CTDR can detect short intermittent faults in wires, shorter than one microsecond, paving the way to the early detection of incipient defects long before they impact the quality of service of the system, for wire and connector defect prognostics.
引用
收藏
页码:1688 / 1690
页数:3
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