Machine Learning Application for Refrigeration Showcase Fault Discrimination

被引:0
作者
Santana, Adamo [1 ]
Fukuyama, Yoshikazu [2 ]
Murakami, Kenya [3 ]
Matsui, Tetsuro [3 ]
机构
[1] Fed Univ Para, Computat Intelligence Lab, Belem, Para, Brazil
[2] Meiji Univ, Dept Network Design, Tokyo, Japan
[3] Fuji Elect, Corp R&D Headquarters, Tokyo, Japan
来源
PROCEEDINGS OF THE 2016 IEEE REGION 10 CONFERENCE (TENCON) | 2016年
关键词
clustering; machine learning; refrigeration showcase; supervised learning; unary classification;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Open refrigeration showcases are commonly utilized equipment in super markets and convenience stores to maintain the temperature and quality of foods and drinks. Often set in a broader refrigeration arrangement, where a number of showcases and outdoor condensers are connected, it is a system that remains susceptible to fault events, which can lead to financial losses for stores. Therefore, faults and early abnormal behaviors that can lead to future problems should be identified. To classify events as in-control of faulty, samples or patterns for both types of events are needed, however, it is often the case in practical industrial applications where only the in-control type of data is available. This paper assesses the applicability of the machine learning approaches for supervised and unsupervised learning in the task of identifying unusual behavior in real showcase data.
引用
收藏
页码:10 / 13
页数:4
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