Hydrogen diffusion in the hydrogen collision model of amorphous silicon metastability

被引：1

作者：

Branz, HM ^{[1
]}

机构：

[1] Natl Renewable Energy Lab, Golden, CO 80401 USA

来源：

AMORPHOUS AND HETEROGENEOUS SILICON THIN FILMS: FUNDAMENTALS TO DEVICES-1999 | 1999年 / 557卷

关键词：

D O I：

10.1557/PROC-557-377

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The trap-controlled model of H diffusion that underpins the H collision model of amorphous silicon metastability provides new insight into thermal and light-enhanced H diffusion in a-Si:H. The longstanding puzzle of the linear DB-dependence of diffusion coefficient with doping is resolved. Expressions for the light-induced H diffusion coefficient are derived with and without D-for-H exchange reactions. It is shown that D-for-H exchange does not affect the long-time diffusion coefficient that is measured under illumination.

引用

页码：377 / 382

页数：6

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