Relationship between crack growth resistance curves and critical CTOA

被引:16
作者
Lu, Longkun [1 ]
Wang, Shengnan [1 ]
机构
[1] Northwestern Polytech Univ, Sch Aeronaut, Xian 710072, Peoples R China
关键词
Critical CTOA; K-R curves; Thickness; Stable crack growth; RESIDUAL STRENGTH ANALYSES; FRACTURE; PANELS; CONSTRAINT;
D O I
10.1016/j.engfracmech.2016.12.010
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
The relationship between K-R curves and critical CTOA is investigated in this paper. A novel CFOA calculation method is proposed, where the load and physical crack extension size are the only data required to be measured. The critical CTOA values are then determined from corresponding K-R curves. The calculated CTOA values are within 5% of ones from corresponding literatures. The relationship between K-R curves and critical CFOA values has also been discussed. It is sufficient to calculate critical CTOA values just from K-R curves. Unloading compliance does consider the effects of tunneling, and physical crack extension data measured from unloading compliance may give a better assessment of CTOA values. For certain material, a steeper K-R curve will lead to a larger CFOA, and there exist upper and lower limit values for critical CTOA that correspond to plane stress and plane strain state respectively. (C) 2016 Elsevier Ltd. All rights reserved.
引用
收藏
页码:146 / 156
页数:11
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