Accurate charge densities from powder X-Ray diffraction

被引：0

作者：

Jorgensen, Mads Ry Vogel ^{[1
,2
]}

Tolborg, Kasper ^{[3
,4
]}

Kasai, Hidetaka ^{[5
]}

Becker, Jacob ^{[3
,4
]}

Dippel, Ann-Christin ^{[6
]}

Als-Nielsen, Jens ^{[7
]}

Iversen, Bo Brummerstedt ^{[3
,4
]}

机构：

[1] Aarhus Univ, Dept Chem, Aarhus C, Denmark

[2] MAX IV Lab, Aarhus C, Denmark

[3] Aarhus Univ, Dept Chem, Ctr Mat Crystallog, Aarhus C, Denmark

[4] Aarhus Univ, iNANO, Aarhus C, Denmark

[5] Univ Tsukuba, CiRfSE & TIMS, Fac Pure & Appl Sci, 1-1-1 Tennodai, Tsukuba, Ibaraki 3058571, Japan

[6] Deutsch Elektronen Synchrotron DESY, PETRA 3, Hamburg, Germany

[7] Univ Copenhagen, Niels Bohr Inst, Copenhagen, Denmark

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2017年 / 73卷

关键词：

Electron density; Synchrotron radiation; Powder X-ray diffraction;

D O I：

10.1107/S2053273317081918

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

MS112.O01

引用

页码：C1385 / C1385

页数：1

共 3 条

[1] Contemporary X-ray electron-density studies using synchrotron radiation [J].

Jorgensen, Mads R. V. ;

Hathwar, Venkatesha R. ;

Bindzus, Niels ;

Wahlberg, Nanna ;

Chen, Yu-Sheng ;

Overgaard, Jacob ;

Iversen, Bo B. .

IUCRJ, 2014, 1 :267-280

[2]

Tolborg K, ACTA CRYST B UNPUB

[3] Synchrotron powder diffraction of silicon: high-quality structure factors and electron density [J].

Wahlberg, Nanna ;

Bindzus, Niels ;

Bjerg, Lasse ;

Becker, Jacob ;

Dippel, Ann-Christin ;

Iversen, Bo Brummerstedt .

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2016, 72 :28-35

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