The use of a piezoelectric force sensor in the magnetic force microscopy of thin permalloy films

被引：3
作者：
Cherkun, A. P. [1 ]
Mishakov, G., V [2 ]
Sharkov, A., V [3 ]
Demikhov, E., I [3 ]
机构：
[1] Russian Acad Sci, Inst Spect, Moscow 108840, Russia
[2] Russian Acad Sci, Fed Sci Res Ctr Crystallog & Photon, Moscow 119333, Russia
[3] Russian Acad Sci, PN Lebedev Phys Inst, Moscow 119991, Russia
来源：
ULTRAMICROSCOPY | 2020年 / 217卷
基金：
俄罗斯基础研究基金会;
关键词：
Magnetic force microscopy; Force sensor; Piezoelectric sensor; Force amplification; Force noise; Ultrathin permalloy film; SAMPLE DISTANCE CONTROL; QUARTZ TUNING FORKS; RESOLUTION;
D O I：
10.1016/j.ultramic.2020.113072
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A piezoelectric force sensor is suggested for magnetic force microscopy (MFM) purposes. Added between the piezoelectric resonator and the magnetic probe is a mechanical force amplifier in the form of a thin, long resonant arm with an integral micro-rod whereby the amplitude of the force acting on the probe is amplified by a factor of 20 to 40 at a low noise level. When the sensor was operated in air, its noise floor was found to be 1.4 pN (RMS) at a bandwidth of 100 Hz. The piezoelectric sensor requires no repeated calibration; and it is capable of operating in a vacuum, and at cryogenic temperatures. By using this sensor we carried out the MFM of ultrathin (1.5- and 3-nm-thick) Ni79Fe21 permalloy films. The 1.5-nm-thick permalloy films studied have a nanoisland structure, whereas 3-nm-thick ones are contiouous. Domain structures were found in both. The MFM image was found to suffer substantial changes when the external magnetic field was altered by 1 Oe. The structures under study featured both "elastic" and "viscous" magnetic force components.
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页数：7
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