Avalanche photodiode based optical coherence tomography

被引:2
作者
Cernat, R [1 ]
Podoleanu, A [1 ]
Gnewuch, H [1 ]
机构
[1] Natl Inst Laser Plasma & Radiat Phys, Bucharest, Romania
来源
OPTICAL SENSING | 2004年 / 5459卷
关键词
avalanche photodiode; silicon pin photodiode; excess photon noise; optical coherence tomography;
D O I
10.1117/12.545421
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Optical Coherence Tomography (OCT) is used to perform in vivo high-resolution imaging of biological tissue microstructures. In the present study, we evaluate the optimum conditions to use Avalanche photodiodes (APDs) in OCT to achieve maximum signal-to-noise (S/N) ratios. The optical sources employed in OCT have a large bandwidth. Due to beating within the source line-width, excess photon noise (EPN) is generated in addition to shot noise (SN). Usually, high speed OCT requires large optical power, which makes the EPN to dominate over the SN. Therefore, balanced detection is used to reduce the EPN. We analyse the optimisation of the OCT configuration with respect to the APD noise performance. When using APDs, another parameter has to be considered in the S/N analysis: that of the voltage across the APDs, which determines, both, the gain and the noise.
引用
收藏
页码:185 / 191
页数:7
相关论文
共 7 条
  • [1] Hamamatsu, 2001, CHARACTERISTICS USE
  • [2] MORKEL PR, 1990, ELECT LETT, V26
  • [3] PODOLEANU AG, 2000, APPL OPTICS, V39
  • [4] PODOLEANU AG, 2004, OPTICS LETT, V29
  • [5] SORIN WV, 1999, IEEE PHOTONICS TECHN, V4
  • [6] TAKADA K, 1998, IEEE J QUANTUM ELECT, V34
  • [7] WEEB RH, 1974, RCA REV, V35, P234