Single and Multi-Spot Current Density Distribution

被引:0
作者
Malucci, Robert D. [1 ]
机构
[1] RD Malucci Consulting, Naperville, IL 60565 USA
来源
PROCEEDINGS OF THE SIXTY-SECOND IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS | 2016年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper provides an analysis of the current density distribution in a single circular contact spot for cases that represents geometrical configurations that are closer to what occurs in real contacting members. In the past, flat contact spots have been used to estimate current density distributions for single circular spots by assuming that bridge conditions do not exist. However, the bridge condition changes the current density at the edge of the contact spot. With no bridge, the mixed boundary conditions for voltage and electric field lie in a plane and give rise to infinite current densities at the edge of the contact spot. In the present paper, when bridge geometries exist, it was found the mixed boundary conditions do not lie in a plane and give rise to finite current densities at the edges. In this work, electromagnetic theory was used to calculate the current density distribution that occurs for bridge geometries. These results are subsequently compared to the traditional results that are often used in analyses and show as the slope of the bridge increases, the current density at the edge decreases to finite values. In addition, it was seen that as the slope increases the current density tends to even out across the contact spot. Consequently, it is seen that the bridge condition at the contact spot may impact the degradation rate for current density driven mechanisms such as electromigration. In addition, to complete the picture, the impact on average current density in individual spots is reviewed regarding the effects of spot size and position in the contact region.
引用
收藏
页码:100 / 104
页数:5
相关论文
共 16 条
  • [1] Aronstein J., 1995, P 41 IEEE HOLM C EL
  • [2] Aronstein J., 1996, P 42 IEEE HOLM C EL
  • [3] Black J.R., 1968, TR68243 RADC
  • [4] Braunovic Milenko, 1999, ELECT CONTACTS, P210
  • [5] Greenwood J.A., 1966, BRIT J APPL PHYS, V17
  • [6] Hare K.T., 1996, P 42 IEEE HOLM C EL
  • [7] Jackson, 1963, CLASSICAL ELECTRODYN, P89
  • [8] Malucci R.D., 2009, P 55 IEEE HOLM C EL
  • [9] Malucci R.D., 2014, P 60 IEEE HOLM C EL
  • [10] Malucci R.D., 2015, P 60 IEEE HOLM C EL