Unambiguous evidence of the existence of polarization field crossover in a semipolar InGaN/GaN single quantum well

被引:46
作者
Shen, H. [1 ]
Wraback, M. [1 ]
Zhong, H. [2 ,3 ]
Tyagi, A. [2 ,3 ]
DenBaars, S. P. [2 ,3 ]
Nakamura, S. [2 ,3 ]
Speck, J. S. [2 ,3 ]
机构
[1] USA, Res Lab, Adelphi, MD 20783 USA
[2] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
[3] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
关键词
electroreflectance; gallium compounds; III-V semiconductors; indium compounds; light polarisation; semiconductor growth; semiconductor quantum wells; PIEZOELECTRIC FIELD; MODULATION SPECTROSCOPY; ELECTROREFLECTANCE; HETEROSTRUCTURES; SEMICONDUCTORS; DIODES;
D O I
10.1063/1.3167809
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present an electroreflectance study of the piezoelectric field in a semipolar (10 (11) over bar) oriented In(0.15)Ga(0.85)N quantum well (QW). The flatband condition is precisely determined by examining the zero-crossing of the electroreflectance signal. The polarization field determined by the flatband condition is 840 +/- 150 kV/cm, in the direction opposite to the built-in field. The corresponding polarization charge at the heterointerface is 0.008 +/- 0.002 C/m(2). Our experimental result indicates that in the semipolar InGaN/GaN QW there is a crossover angle between the C-axis and the growth direction where the polarization field vanishes.
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页数:3
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