Structure Characterization of Bulk Single Crystals Using X-Ray Back Reflection Methods.

被引：5
作者：
Zhang, Hui [1 ,2 ]
Paufler, Peter [1 ]
机构：
[1] Tech Univ Dresden, Inst Struct Phys, D-01062 Dresden, Germany
[2] Max Planck Inst Chem Phys Solids, D-01087 Dresden, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2004年 / 60卷
关键词：
Laue back reflection method; Kossel method; NiAl;
D O I：
10.1107/S0108767304094383
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
s13.m37.p9
引用
收藏
页码：S283 / S283
页数：1
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1