Figures of Uncertainty for Noise Measurements

被引：0

作者：

Seelmann-Eggebert, M. ^{[1
]}

Baldischweiler, B. ^{[1
]}

Aja, B. ^{[2
]}

Bruch, D. ^{[1
,2
]}

Massler, H. ^{[1
]}

机构：

[1] Fraunhofer Inst Appl Solid State Phys, D-79108 Freiburg, Germany

[2] Univ Cantabria, Santander, Spain

来源：

2013 81ST ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG) | 2013年

关键词：

noise figure; noise parameters; low-noise transistor; microwave noise measurements; error analysis; uncertainty; deembedding;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we introduce two figures of uncertainty (FOU) for the assessment of noise figure measurements. These figures of uncertainty are readily determined if the scattering parameters of the device under test (DUT) are available. The two FOUs provide two types of information. On one hand side, they allow for a simple consistency check of the two measurements. On the other side, they give a measure for the accuracy and reliability of the noise figure, which in many cases may be limited due to second stage corrections. We suggest to include the two FOUs routinely as supplements for noise figure measurements.

引用

页数：4