Deformation kinetics of steady creep in Sn/Pb solder alloys with applications

被引:2
作者
Lee, CF [1 ]
Chang, MK
Chung, WK
机构
[1] Natl Cheng Kung Univ, Dept Engn Sci, Tainan 70101, Taiwan
[2] Nanya Tech Co, Assy Test Engn Sec, Taoyuan 333, Taiwan
关键词
steady creep rates; constitutive equation; internal variable; deformation kinetics; tilted potential barrier; Sn/Pb solders;
D O I
10.1017/S1727719100003300
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
In this paper, a constitutive equation of steady creep rates: epsilon(s) = K(1)(0)e(-epsilon0/RT) sinh K-2 (sigma-sigma(0))/[log16epsilon(0)/RT - log K-2 (sigma - sigma(0))] is derived based on a liaison of the theory of irreversible thermodynamics of continuous media with internal state variables (ISV); and the deformation kinetics. In steady creep, only one ISV is used, whose evolution equation is derived by the concepts of deformation kinetics, in which micromotions are generated by a group of atoms climbing over a tilted potential barrier of the highest height epsilon(0). Applications of the constitutive equation in the cases of some Sn/Pb solder alloys-63Sn/37Pb, 60Sn/40Pb and 97.5Pb/2.5Sn under shear creep tests; and 98Pb/2Sn under tensile creep tests, show that the theoretical results can describe the experimental data quite well. These results pace the way for future research in the comparisons of creep resistance among solders with various Sn/Pb compositions and in the generalization of three-dimensional constitutive equation.
引用
收藏
页码:85 / 93
页数:9
相关论文
共 14 条
  • [1] CONSTITUTIVE RELATIONS FOR TIN-BASED SOLDER JOINTS
    DARVEAUX, R
    BANERJI, K
    [J]. IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1992, 15 (06): : 1013 - 1024
  • [2] FROST HJ, 1988, IEEE T COMPON HYBR, V11, P371, DOI 10.1109/33.16670
  • [3] Krausz A.S., 1975, Deformation Kinetics, V1
  • [4] MACIUCESCU L, 1997, ASME EEP, V19, P1615
  • [5] MCDOWELL DL, 1994, AM SOC TEST MATER, V1153, P42, DOI 10.1520/STP23915S
  • [6] Morris Jr J.W., 1997, ASME EEP, V19-2, P1529
  • [7] RASSAIAN M, 1999, ASME EEP, V26, P2031
  • [8] SASAKI K, 2001, ASME, P379
  • [9] SHI XQ, 2000, IEEE ELECT COMPONENT, V3, P398
  • [10] SOLOMON HD, 1991, SOLDER JOINT RELIABI, P406