共 27 条
[4]
CHEMICAL-ANALYSIS OF INORGANIC AND ORGANIC-SURFACES AND THIN-FILMS BY STATIC TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS)
[J].
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION IN ENGLISH,
1994, 33 (10)
:1023-1043
[6]
Briggs D., 1989, HDB STATIC SECONDARY
[7]
Castro F., UNPUB