An instrument for the high temperature measurement of the Seebeck coefficient and electrical resistivity

被引:16
作者
Gunes, Murat [1 ]
Parlak, Mehmet [2 ]
Ozenbas, Macit [3 ]
机构
[1] Middle E Tech Univ, Micro & Nanotechnol Grad Program, TR-06800 Ankara, Turkey
[2] Middle E Tech Univ, Dept Phys, TR-06800 Ankara, Turkey
[3] Middle E Tech Univ, Dept Met & Mat Engn, TR-06800 Ankara, Turkey
关键词
thermoelectrics; beadless thermocouple; magnetic field elimination; differential; temperature; electrical resistivity; THERMOELECTRIC-MATERIALS; THERMAL-CONDUCTIVITY; THERMOPOWER; POWER; APPARATUS; SEMICONDUCTORS; NIOBIUM;
D O I
10.1088/0957-0233/25/5/055901
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A system for the simultaneous measurement of thermoelectric power and resistivity of one and/ or two samples over a temperature range of 300-1000 K in a vacuum chamber is designed and implemented. A sample probe is developed to provide its easy mounting and usage. In addition, two samples can be measured at the same time. Measurement accuracy has been enhanced by beadless thermocouples and micro-heaters that are specifically designed in order to minimize the 'cold-finger effect' and to eliminate some possible source of contact, design and measurement errors. A broad range of physical types and shapes of samples, such as bulk, bar or disc, can be measured by a software controlled system. A differential steady-state method has been applied for Seebeck coefficient measurement. Resistivity measurement is conducted with the axial technique of the four-point probe method. Platinum wire and a niobium rod are chosen as the standard samples. The total data error for the Seebeck coefficient and resistivity measurements is estimated to be less than 2.6% and 1%, respectively.
引用
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页数:10
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共 40 条
  • [1] RESISTIVITY OF HIGH-PURITY NIOBIUM FROM 20 DEGREES K TO MELTING TEMPERATURE
    ABRAHAM, JM
    DEVIOT, B
    [J]. JOURNAL OF THE LESS-COMMON METALS, 1972, 29 (03): : 311 - &
  • [2] The electrical resistance response of continuous carbon fibre composite laminates to mechanical strain
    Angelidis, N
    Wei, CY
    Irving, PE
    [J]. COMPOSITES PART A-APPLIED SCIENCE AND MANUFACTURING, 2004, 35 (10) : 1135 - 1147
  • [3] APPARATUS FOR MEASURING THERMOELECTRIC POWER AND ELECTRICAL CONDUCTIVITY OF SEMICONDUCTORS UP TO 1000 DEGREES C
    ASTAKHOV, OP
    LOBANKOV, VV
    SURKOV, BM
    [J]. MEASUREMENT TECHNIQUES, 1972, 15 (06) : 889 - 890
  • [4] High temperature Seebeck coefficient and resistance measurement system for thermoelectric materials in the thin disk geometry
    Bottger, P. H. Michael
    Flage-Larsen, E.
    Karlsen, O. B.
    Finstad, Terje G.
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (02)
  • [5] Calculation of the Thermoelectric Power of Vanadium, Niobium, and Tantalum
    Brodowsky, Horst
    Chen, Qiyuan
    Xiao, Zhongliang
    Yin, Zhoulan
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2011, 40 (09) : 1984 - 1989
  • [6] Burkov A T, 2006, THERMOELECTRIC HDB M, V22, P9
  • [7] Experimental set-up for thermopower and resistivity measurements at 100-1300 K
    Burkov, AT
    Heinrich, A
    Konstantinov, PP
    Nakama, T
    Yagasaki, K
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2001, 12 (03) : 264 - 272
  • [8] Experimental setup for measurements of transport properties at high temperature and under controlled atmosphere
    Byl, Celine
    Berardan, David
    Dragoe, Nita
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2012, 23 (03)
  • [9] Crawford R.B., 1962, IND APPL TEMPERATURE, V3, P913
  • [10] Electrical, Thermal, and Mechanical Characterization of Novel Segmented-Leg Thermoelectric Modules
    D'Angelo, Jonathan
    Case, Eldon D.
    Matchanov, Nuraddin
    Wu, Chun-I
    Hogan, Timothy P.
    Barnard, James
    Cauchy, Charles
    Hendricks, Terry
    Kanatzidis, Mercouri G.
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2011, 40 (10) : 2051 - 2062