Structural study of 1,4-cyclohexadiene adsorption on Si(001) surface by low energy photoelectron diffraction

被引：7
作者：
Gunnella, R
Shimomura, M
Munakata, M
Takano, T
Yamazaki, T
Abukawa, T
Kono, S
机构：
[1] Univ Camerino, Dipartimento Fis, Udr INFM, I-62032 Camerino, MC, Italy
[2] Ist Nazl Fis Nucl, LNF, I-00013 Frascati, Italy
[3] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai, Miyagi 9808577, Japan
来源：
SURFACE SCIENCE | 2004年 / 566卷
关键词：
chemisorption; carbon; self-assembly; photoemission (total yield); surface structure; morphology; roughness; and; topography;
D O I：
10.1016/j.susc.2004.05.122
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The structural properties of the subsaturation coverage of 1,4-cyclohexadiene (C6H8) on single domain Si(001)-2 x 1 surface have been investigated by using photoelectron diffraction (PD) at the Cls core level and at the photon energy of 330 eV. The high resolution core level study allows to determine the presence of a shifted replica of +0.9 eV in kinetic energy. The structural properties of adsorbed molecules are discussed at the light of ab initio multiple scattering calculations on several adsorption models with about the same least total energy. This quantitative experimental determination timely follows the many qualitative assessments present in literature for this important prototypical case of functional Si substrate and aims to fill the gaps between several experiments reported. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：618 / 623
页数：6
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