Localised electrochemical impedance spectroscopy with high lateral resolution by means of alternating current scanning electrochemical microscopy

被引：1
|
作者：
Katemann, BB
Schulte, A
Calvo, EJ
Koudelka-Hep, M
Schuhmann, W
机构：
[1] Ruhr Univ Bochum, D-44780 Bochum, Germany
[2] Univ Buenos Aires, Fac Ciencias Exactas & Nat, INQUIMAE, AR-1428 Buenos Aires, DF, Argentina
[3] Univ Neuchatel, Inst Microtechnol, CH-2000 Neuchatel, Switzerland
来源：
ELECTROCHEMISTRY COMMUNICATIONS | 2002年 / 4卷 / 02期
关键词：
scanning electrochemical microscopy; SECM; electrochemical impedance spectroscopy; microelectrode;
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
A new method for measuring local interfacial impedance properties with high lateral resolution was developed by combination of electrochemical impedance spectroscopy (EIS) with scanning electrochemical microscopy (SECM). Alternating current scanning electrochemical microscopy (AC-SECM) allowed to identify and visualise microscopic domains of different con ductivity/electrochemical activities on solid/liquid interfaces immersed into an electrolyte. The performance of the method was illustrated by imaging an array of Pt-band microelectrodes in solutions of low conductivity in the absence of any redox mediator. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：134 / 138
页数：5
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