A spectrometer for low energy heavy ion ERDA

被引:60
作者
Kottler, C.
Doebeli, M. [1 ]
Glaus, F.
Suter, M.
机构
[1] ETH Honggerberg, Paul Scherrer Inst, IPP HPK H32, CH-8093 Zurich, Switzerland
[2] Paul Scherrer Inst, Lab Micro & Nanotechnol, PSI, CH-5232 Villigen, Switzerland
[3] ETH, Inst Particle Phys, CH-8093 Zurich, Switzerland
关键词
ERDA; silicon nitride; membranes; gas ionization detectors; time-of-flight;
D O I
10.1016/j.nimb.2006.02.013
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An ERDA detector telescope consisting of a time-of-flight (ToF) system combined with a gas ionization chamber (GIC) has been developed which is specialized for the identification of very low energy ions. Equipped with a large area patterned silicon nitride entrance window of 130 nm thickness, the GIC allows heavy ion detection well below 1 MeV with sufficient resolution for particle identification. The ToF system has a start detector with a diamond-like carbon (DLC) foil of only 0.5 mu g/cm(2), which warrants excellent energy resolution for depth profiling. The system has been tested with I-121, Au-197 and Ti-48 projectiles of energies between 1.5 and 12 MeV. In the low mass range (up to 30 amu) the mass resolution is better than 1 in 35 at a recoil energy of approximately 3 MeV. A depth resolution of 1.5 nm (FWHM) has been obtained at a TiO2 surface using 1.5 MeV 1271 projectiles. The spectrometer is well suited for high resolution near-surface ERDA analysis even at accelerators with very low beam energies. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:155 / 162
页数:8
相关论文
共 16 条
[1]  
[Anonymous], 1995, Handbook of Modern Ion Beam Material Analysis
[2]   IONIZATION CHAMBERS FOR MATERIALS ANALYSIS WITH HEAVY-ION BEAMS [J].
ASSMANN, W .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 64 (1-4) :267-271
[3]   Simulated annealing analysis of Rutherford backscattering data [J].
Barradas, NP ;
Jeynes, C ;
Webb, RP .
APPLIED PHYSICS LETTERS, 1997, 71 (02) :291-293
[4]   A CURVED DETECTION SLIT TO IMPROVE ERD ENERGY AND DEPTH RESOLUTION [J].
BRICE, DK ;
DOYLE, BL .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 45 (1-4) :265-269
[5]   A POSITION-SENSITIVE TRANSMISSION TIME DETECTOR [J].
BUSCH, F ;
PFEFFER, W ;
KOHLMEYER, B ;
SCHULL, D ;
PUHLHOFFER, F .
NUCLEAR INSTRUMENTS & METHODS, 1980, 171 (01) :71-74
[6]   Development of an external beam nuclear microprobe on the Aglae facility of the Louvre museum [J].
Calligaro, T ;
Dran, JC ;
Ioannidou, E ;
Moignard, B ;
Pichon, L ;
Salomon, J .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 161 :328-333
[7]  
Chu W. K., 1978, Backscattering Spectrometry
[8]   Silicon nitride thin windows for biomedical microdevices [J].
Ciarlo, DR .
BIOMEDICAL MICRODEVICES, 2002, 4 (01) :63-68
[9]   ERDA at the low energy limit [J].
Döbeli, M ;
Kottler, C ;
Glaus, F ;
Suter, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 241 (1-4) :428-435
[10]   Gas ionization chambers with silicon nitride windows for the detection and identification of low energy ions [J].
Döbeli, M ;
Kottler, C ;
Stocker, M ;
Weinmann, S ;
Synal, HA ;
Grajcar, M ;
Suter, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2004, 219 :415-419