Optical and structural properties of GaN epitaxial layers on LiAlO2 substrates and their correlation with basal-plane stacking faults

被引:4
作者
Lutsenko, E. V. [1 ]
Rzheutski, M. V. [1 ]
Pavlovskii, V. N. [1 ]
Yablonskii, G. P. [1 ]
Alanzi, M. [2 ]
Hamidalddin, A. [2 ]
Alyamani, A. [2 ]
Mauder, C. [3 ]
Kalisch, H. [4 ]
Reuters, B. [4 ]
Heuken, M. [3 ,4 ]
Vescan, A. [4 ]
Naresh-Kumar, G. [5 ]
Trager-Cowan, C. [5 ]
机构
[1] Natl Acad Sci Belarus, BI Stepanov Inst Phys, Minsk 220072, BELARUS
[2] Natl Nanotechnol Ctr, KACST, Riyadh 11442, Saudi Arabia
[3] AIXTRON SE, D-52134 Herzogenrath, Germany
[4] Rhein Westfal TH Aachen, GaN Device Technol, D-52074 Aachen, Germany
[5] Univ Strathclyde, Dept Phys, SUPA, Glasgow G4 0NG, Lanark, Scotland
关键词
Defects; Stresses; X-ray diffraction; Metalorganic chemical vapor deposition; Nitrides; Semiconducting III-V materials; 11(2)OVER-BAR0 GAN; MICROSTRUCTURE; POLARIZATION; TRANSITIONS; SAPPHIRE; EMISSION; DEFECTS; STRAIN; GROWTH;
D O I
10.1016/j.jcrysgro.2015.10.036
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The optical and structural properties of m-plane GaN layers grown by metal organic vapor phase epitaxy on LiAlO2 (100) substrates were investigated. Temperature-dependent and time-resolved photoluminescence (PL), X-ray diffraction and Raman scattering measurements were performed to analyze the correlation of the sample properties with the density of l(1)-type basal-plane stacking faults (BSFs). Electron channeling contrast imaging was used to reveal and calculate the density of BSFs reaching the surface of an m-plane GaN/LiAlO2 layer. It was shown that a local increase of BSF density in the investigated samples results in a rise of the total PL efficiency at low temperatures because of the localization of excitons at BSFs and, therefore, a suppression of their diffusion to nonradiative centers. Parameters of time decay and temperature quenching of the BSF-related PL band were determined. A correlation of both epsilon(xx) and epsilon(ZZ) strain components with the BSFs and crystal mosaicity was observed, and possible reasons of this correlation are discussed. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:62 / 66
页数:5
相关论文
共 35 条
[1]   Optical evidence for lack of polarization in (1120) oriented GaN/(AlGa)N quantum structures [J].
Akopian, N ;
Bahir, G ;
Gershoni, D ;
Craven, MD ;
Speck, JS ;
DenBaars, SP .
APPLIED PHYSICS LETTERS, 2005, 86 (20) :1-3
[2]   Optical polarization in c-plane Al-rich AlN/AlxGa1-xN single quantum wells [J].
Al Tahtamouni, T. M. ;
Lin, J. Y. ;
Jiang, H. X. .
APPLIED PHYSICS LETTERS, 2012, 101 (04)
[3]  
Berkowicz E, 1999, PHYS STATUS SOLIDI B, V216, P291, DOI 10.1002/(SICI)1521-3951(199911)216:1<291::AID-PSSB291>3.0.CO
[4]  
2-O
[5]   Hydrogen-induced improvements in optical quality of GaNAs alloys [J].
Buyanova, IA ;
Izadifard, M ;
Chen, WM ;
Polimeni, A ;
Capizzi, M ;
Xin, HP ;
Tu, CW .
APPLIED PHYSICS LETTERS, 2003, 82 (21) :3662-3664
[6]   Exciton localization on basal stacking faults in a-plane epitaxial lateral overgrown GaN grown by hydride vapor phase epitaxy [J].
Corfdir, P. ;
Lefebvre, P. ;
Levrat, J. ;
Dussaigne, A. ;
Ganiere, J. -D. ;
Martin, D. ;
Ristic, J. ;
Zhu, T. ;
Grandjean, N. ;
Deveaud-Pledran, B. .
JOURNAL OF APPLIED PHYSICS, 2009, 105 (04)
[7]   Surface striation, anisotropic in-plane strain, and degree of polarization in nonpolar m-plane GaN grown on [J].
Feng, Shih-Wei ;
Yang, Chih-Kai ;
Lai, Chih-Ming ;
Tu, Li-Wei ;
Sun, Qian ;
Han, Jung .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2011, 44 (37)
[8]   Effects of macroscopic polarization in III-V nitride multiple quantum wells [J].
Fiorentini, V ;
Bernardini, F ;
Della Sala, F ;
Di Carlo, A ;
Lugli, P .
PHYSICAL REVIEW B, 1999, 60 (12) :8849-8858
[9]   Cathodoluminescence spectroscopy of epitaxial-lateral-overgrown nonpolar (11-20) and semipolar (11-22) GaN in relation to microstructural characterization [J].
Guhne, T. ;
Bougrioua, Z. ;
Vennegues, P. ;
Leroux, M. ;
Albrecht, M. .
JOURNAL OF APPLIED PHYSICS, 2007, 101 (11)
[10]   Impacts of anisotropic tilt mosaics of state-of-the-art m-plane freestanding GaN substrates on the structural and luminescent properties of m-plane AlxGa1-xN epilayers [J].
Hazu, K. ;
Kagaya, M. ;
Hoshi, T. ;
Onuma, T. ;
Chichibu, S. F. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2011, 29 (02)