Investigation of Back Scattering Properties of Thin Films Consisting of a Set of Small-Size Particles

被引：0

作者：

Andriychuk, Mykhaylo ^{[1
,2
]}

机构：

[1] Lviv Polytech Natl Univ, Dept Numer Methods Mathematicak Phys, Pidstryhach Inst Appl Problems Mech & Math, NASU, Lvov, Ukraine

[2] Lviv Polytech Natl Univ, Dept Comp Aided Design Syst, Lvov, Ukraine

来源：

2019 IEEE 15TH INTERNATIONAL CONFERENCE ON THE EXPERIENCE OF DESIGNING AND APPLICATION OF CAD SYSTEMS (CADSM'2019) | 2019年

关键词：

small-size particle; back scattering; asymptotic approach; explicit analytical solution; computational modeling; ELECTROMAGNETIC-WAVE SCATTERING; NEGATIVE REFRACTION; CREATING MATERIALS; BODIES; METAMATERIALS;

D O I：

10.1109/cadsm.2019.8779319

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The problem of electromagnetic (EM) wave scattering on structures consisting of a set of small bodies (particles) is studied in the framework of asymptotic approach. It is assumed that size of particle is small in comparison with the length of wave and the distance between the separate particles is one order greater than its characteristic size. An analytical form of solution to problem is derived. The scattering properties are investigated for different geometrical properties of structure and for various types of an incident wave.

引用

页数：5

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