Imaging with Nanometer Resolution Using Optically Active Defects in Silicon Carbide

Nanostructured and bulk silicon carbide (SiC) materials are relevant for electronics, nano- and micromechanical systems, and biosensing applications. SiC has recently emerged as an alternative platform for nanophotonics and quantum applications due to its intra-band-gap point defects, emitting from the visible to the near-infrared, which are ideal for photoluminescent probes. Here, we use a single-molecule localization microscope to study the photoluminescence (PL) properties of SiC point defects in bulk, quantum dots, and nanoparticles of different sizes in the 3C and 4H-SiC polytypes using intra-band-gap excitation. We study the PL dynamics by using different excitation wavelengths, and we use the point-defect PL intermittency to achieve superresolved images, with a resolution of 20 nm and a minimum distance between emitters of 40 nm. We observe that, while 561 nm is an ideal excitation wavelength to obtain a sufficient blinking behavior, 638 nm is mostly quenching the PL. We further incubate 4H-SiC nanoparticles with MCF10A cells in vitro and observe superresolved images of the nanoparticles in cells by combining 561 and 638 nm excitation. This approach is very promising for the application of SiC fluorescent nanocrystals and their quantum dots, hosting a combination of intra-band-gap color centers and surface defects, for quantum nanophotonics, magnetic sensing, and biomedical imaging, paving the way for single-particle tracking combined with spin sensing within a cellular environment using near-infrared emission.