A 16b Clockless Digital-to-Analog Converter with Ultra-Low-Cost Poly Resistors Supporting Wide-Temperature Range from-40°C to 85°C

被引：1

作者：

Wang, Xuedi ^{[1
]}

Li, Xueqing ^{[1
]}

Lai, Longqiang ^{[1
]}

Yang, Huazhong ^{[1
]}

机构：

[1] Tsinghua Univ, Beijing, Peoples R China

来源：

GLSVLSI '19 - PROCEEDINGS OF THE 2019 ON GREAT LAKES SYMPOSIUM ON VLSI | 2019年

关键词：

digital to analog converter; calibration; resistor mismatch; INL;

D O I：

10.1145/3299874.3318014

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

High-precision digital-to-analog converter (DAC) is a critical component in process control, data acquisition, and testing instruments. In order to achieve high resolution and a wide-temperature range, conventional designs have been adopting high-cost thin-film resistors with laser-trimming to improve the matching property and thus the DAC resolution. In this work, targeting at lowering the cost, we propose an analog resistor redundancy, full code, and piecewise-linear calibration scheme to enable the use of low-cost poly resistors in a standard CMOS process. In order to overcome the drift over a wide temperature range, a feedback circuit is proposed to guarantee that the resistance of the switch can track the resistor with temperature changes. Therefore, the DAC can be calibrated under a specific temperature and tested under an arbitrary temperature from -40 degrees C to 85 degrees C using the same calibration codes. The 16b DAC was implemented in a 0.25 mu m 5V CMOS process with 5V CMOS devices and poly resistors rather than thin film resistor. The test result shows that it can achieve the INL <= 0.5LSB, INL <= 4LSB, and INL <= 4LSB at 25 degrees C, -40 degrees C and 85. respectively, using the same calibration code. It settles in 1 mu s and it has below 5nV.s glitch. The current consumption is 1.7mA from 5V voltage supplies.

引用

页码：267 / 270

页数：4