X-ray Raman scattering spectroscopy at the ESRF

被引：0
|
作者：
Sahle, Christoph J. [1 ]
机构：
[1] ESRF, Grenoble, France
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2017年 / 73卷
关键词：
XRS; extreme conditions; electronic structure;
D O I：
10.1107/S2053273317090076
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS042.O02
引用
收藏
页码：C566 / C566
页数：1
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