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Diagnosis of sequence-dependent chips
被引:0
|作者:
Li, JCM
[1
]
McCluskey, EJ
[1
]
机构:
[1] Stanford Univ, Ctr Reliable Comp, Stanford, CA 94305 USA
来源:
关键词:
D O I:
暂无
中图分类号:
TP3 [计算技术、计算机技术];
学科分类号:
0812 ;
摘要:
A technique capable of diagnosing single and multiple stuck-open and stuck-at faults is presented. Eleven sequence-dependent chips (test results depend on the order of test patterns) are diagnosed. Seven of them are diagnosed as having single stuck-open faults. Two of them are diagnosed as having multiple stuck-at and stuck-open faults.
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页码:189 / 192
页数:4
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