Diagnosis of sequence-dependent chips

被引：0
|
作者：
Li, JCM [1 ]
McCluskey, EJ [1 ]
机构：
[1] Stanford Univ, Ctr Reliable Comp, Stanford, CA 94305 USA
来源：
20TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2002年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A technique capable of diagnosing single and multiple stuck-open and stuck-at faults is presented. Eleven sequence-dependent chips (test results depend on the order of test patterns) are diagnosed. Seven of them are diagnosed as having single stuck-open faults. Two of them are diagnosed as having multiple stuck-at and stuck-open faults.
引用
收藏
页码：189 / 192
页数：4
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