Laser beam-profile monitor development at BNL for SNS

被引:0
作者
Connolly, R [1 ]
Cameron, P [1 ]
Cupolo, J [1 ]
Gassner, D [1 ]
Grau, M [1 ]
Kesselman, M [1 ]
Peng, S [1 ]
Sikora, R [1 ]
机构
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
来源
BEAM INSTRUMENTATION WORKSHOP 2002 | 2002年 / 648卷
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A beam profile monitor for H- beams based on laser photoneutralization is being developed at Brookhaven National Laboratory (BNL) for use on the Spallation Neutron Source (SNS) [1]. An H- ion has a first ionization potential of 0.75eV and can be neutralized by light from a Nd:YAG laser (lambda=1064nm). To measure beam profiles, a narrow laser beam is passed through the ion beam neutralizing a portion of the H- beam struck by the laser. The laser trajectory is stepped across the ion beam. At each laser position, the reduction of the beam current caused by the laser is measured. A proof-of-principle experiment was done earlier at 750keV. This paper reports on measurements made on 200MeV beam at BNL and with a compact scanner prototype at Lawrence Berkeley National Lab on beam from the SNS RFQ.
引用
收藏
页码:150 / 161
页数:12
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