Display daylight ambient contrast measurement methods and daylight readability

被引：32

作者：

Kelley, Edward F. ^{[1
]}

Lindfors, Max

Penczek, John

机构：

[1] Technol Adm, Natl Inst Stand & Technol, Div Optoelect, Elect & Elect Engn Lab,US Dept Commerce, Boulder, CO 80302 USA

[2] Nokia, Helsinki, Finland

[3] DuPont Displays, Santa Barbara, CA USA

来源：

JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY | 2006年 / 14卷 / 10-12期

关键词：

contrast; daylight readability; diffuse reflectance; display measurements; display readability; display reflection measurements; dynamic range; luminous reflectance factor; maximum readability; reflectance factor; skylight reflection; spectral reflectance factor; sunlight readability; sunlight reflection;

D O I：

10.1889/1.2393026

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Two composite metrics to characterize display reflection, contrast, and readability under daylight illumination is proposed. A measurement of the reflection under directed illumination simulating the sun is combined with a measurement of the reflection under uniform diffuse illumination to simulate the sky. The measurements are performed separately in a laboratory, and then the measurement results are combined and scaled to daylight levels with attention to the proper Spectra involved for the skylight and sunlight.

引用

页码：1019 / 1030

页数：12

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