Comment on 'Enhancement in hardness and transmittance of ZnS via SiO2/Y2O3 multilayer'

被引:1
|
作者
Chung, Yong-Duck [1 ,2 ,3 ,4 ]
Cho, Dae-Hyung [1 ]
Kim, Sung-Bock [1 ]
Han, Won Seok [1 ]
机构
[1] Elect & Telecommun Res Inst, IT Mat & Components Res Lab, Daejeon 34129, South Korea
[2] Korea Univ Sci & Technol, Dept Adv Device Engn, Daejeon 34113, South Korea
[3] Elect & Telecommun Res Inst, IT Mat & Components Res Lab, Daejeon 34129, South Korea
[4] Korea Univ Sci & Technol, Dept Adv Device Engn, Daejeon 34113, South Korea
关键词
Ceramics; Coating materials; Thin films; Photoelectron spectroscopies; CORE LEVELS;
D O I
10.1016/j.jallcom.2015.12.206
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In a recent paper [1], Huayu Zhang et al. reported data on the enhancement in hardness and transmittance of ZnS via SiO2/Y2O3 multilayer. In particular, the authors discussed the chemical state of sputtered Y2O3 on SiO2/ZnS measured by X-ray photoelectron spectroscopy. We suggested that the split spectrum of Y 3d doublet should be decomposed into the sum of the doublet and the exact notation of O 1s level should be applied. The O 1s of 528.8 eV could also be assigned to Y2O3 and the O 1s of 531.5 eV could be assigned to Si related compound. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:648 / 649
页数:2
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