Determination of electron inelastic mean free paths for poly[methyl(phenyl)silylene] films

被引：3

作者：

Zemek, J. ^{[1
]}

Houdkova, J. ^{[1
]}

Jiricek, P. ^{[1
]}

Jablonski, A. ^{[2
]}

Jurka, V. ^{[1
]}

Kub, J. ^{[1
]}

机构：

[1] Acad Sci Czech Republic, Inst Phys, Prague 16253 6, Czech Republic

[2] Polish Acad Sci, Inst Phys Chem, PL-01224 Warsaw, Poland

来源：

POLYMER | 2009年 / 50卷 / 11期

关键词：

Polymer physics; Poly[methyl(phenyl)silylene; Inelastic mean free path; RAY PHOTOELECTRON-SPECTROSCOPY; SURFACE EXCITATION PARAMETER; AMORPHOUS-CARBON FILMS; ANGULAR-DISTRIBUTION; ESCAPE DEPTH; POLYSILANES; POLYMERS; BACKSCATTERING; REFLECTIVITY; DENSITY;

D O I：

10.1016/j.polymer.2009.03.031

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

The inelastic mean free paths (IMFPs) of electrons at a poly[methyl(phenyl)silylene] thin film surface were determined using elastic peak electron spectroscopy (EPES) and Monte Carlo calculations for a wide electron energy range, 200-1600 eV. We considered the surface composition determined from X-ray induced photoelectron spectra (XPS), the hydrogen concentration evaluated by EPES, and a correction for Surface excitations. The results compare well to those calculated from the predictive TPP-2M and G1, formulae. Calculations carried out with the quantitative structure-property relationship of Cumpson and the formula of Ashley and Williams provide larger IMFP values, and can be useful only for a rough estimation. (C) 2009 Elsevier Ltd. All rights reserved.

引用

页码：2445 / 2450

页数：6

共 46 条

[1] ELECTRON MEAN FREE PATHS IN SOLID ORGANIC INSULATORS [J].

ASHLEY, JC ;

WILLIAMS, MW .

RADIATION RESEARCH, 1980, 81 (03) :364-373

[2]

*ASTM INT, 2008, ANN BOOK ASTM STAND, P675

[3]

Bicerano J., 1996, PREDICTION POLYM PRO, V2nd

[4] Monte Carlo simulation of photoelectron angular distribution [J].

Chen, YF .

SURFACE SCIENCE, 1997, 380 (2-3) :199-209

[5] Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure-property relationships [J].

Cumpson, PJ .

SURFACE AND INTERFACE ANALYSIS, 2001, 31 (01) :23-34

[6] ANGLE-RESOLVED XPS AND AES - DEPTH-RESOLUTION LIMITS AND A GENERAL COMPARISON OF PROPERTIES OF DEPTH-PROFILE RECONSTRUCTION METHODS [J].

CUMPSON, PJ .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1995, 73 (01) :25-52

[7] Evaluation of theoretical models for elastic electron backscattering from surfaces [J].

Dubus, A ;

Jablonski, A ;

Tougaard, S .

PROGRESS IN SURFACE SCIENCE, 2000, 63 (06) :135-175

[8] SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

FADLEY, CS ;

BAIRD, RJ ;

SIEKHAUS, W ;

NOVAKOV, T ;

BERGSTROM, SA .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) :93-137

[9] Density, sp3 fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy [J].

Ferrari, AC ;

Li Bassi, A ;

Tanner, BK ;

Stolojan, V ;

Yuan, J ;

Brown, LM ;

Rodil, SE ;

Kleinsorge, B ;

Robertson, J .

PHYSICAL REVIEW B, 2000, 62 (16) :11089-11103

[10] On the use of elastic peak electron spectroscopy (EPES) to measure the H content of hydrogenated amorphous carbon films [J].

Filippi, M. ;

Calliari, L. .

SURFACE AND INTERFACE ANALYSIS, 2008, 40 (11) :1469-1474

← 1 2 3 4 5 →