Fabrication of a single-electron transistor by current-controlled local oxidation of a two-dimensional electron system

被引:86
作者
Keyser, UF
Schumacher, HW
Zeitler, U
Haug, RJ
Eberl, K
机构
[1] Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany
[2] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
关键词
D O I
10.1063/1.125786
中图分类号
O59 [应用物理学];
学科分类号
摘要
The surface layers of a GaAs/AlGaAs heterostructure are locally oxidized using an atomic force microscope. The local anodic oxidation depletes the underlying two-dimensional electron gas leading to the formation of tunneling barriers. The height of the barriers is determined by measuring the thermally activated current. By varying the oxidation current, the barrier heights can be tuned between a few meV and more than 100 meV. Using these barriers as tunneling elements, a side gated single-electron transistor is fabricated. (C) 2000 American Institute of Physics. [S0003- 6951(00)02304-4].
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页码:457 / 459
页数:3
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