Oscillation-test technique for CMOS operational amplifiers by monitoring supply current

被引：21

作者：

Font, J ^{[1
]}

Ginard, J ^{[1
]}

Isern, E ^{[1
]}

Roca, M ^{[1
]}

Segura, J ^{[1
]}

García, E ^{[1
]}

机构：

[1] Univ Illes Balears, Dept Fis, E-07071 Palma de Mallorca, Spain

来源：

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING | 2002年 / 33卷 / 02期

关键词：

oscillation-based test; oscillation-test strategy; analog and mixed-signal test; test observable; supply current test; compensated two-stage CMOS opamps;

D O I：

10.1023/A:1021280302991

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A comparison of the merits and possibilities of considering the output voltage and the negative supply current as test observables when using the Oscillation-test technique is carried out. The method is applied to CMOS opamps considering an exhaustive analysis of catastrophic defects (opens, shorts), GOS and floating gates using HSPICE. We analyze deviations in both frequency and signal amplitude of each observable comparing their sensitivity to defects. Results show that the supply current peak value provides the highest defect coverage for a single opamp oscillator, while the oscillating frequency provides the highest fault coverage for a double opamp oscillator.

引用

页码：213 / 224

页数：12

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