Excitation of rare earth emission in chalcogenide glasses by broadband Urbach edge absorption

被引:69
作者
Bishop, SG
Turnbull, DA
Aitken, BG
机构
[1] Univ Illinois, Dept Elect & Comp Engn, Microelect Lab, Urbana, IL 61801 USA
[2] Corning Inc, Corning, NY 14831 USA
关键词
D O I
10.1016/S0022-3093(99)00859-5
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Studies of photoluminescence (PL) and photoluminescence excitation (PLE) spectroscopy in rare earth (RE)-doped chalcogenide glasses have shown that there are interactions between the fundamental optical absorption and emission processes of the chalcogenide host glasses such as Ge33As12Se55 and the spectrally overlapping intra 4f-shell transitions of Er. Pr and Dy dopants. A broad (similar to 0.5 eV fwhm), near-band edge PLE band is observed in the excitation spectra of RE emission bands in chalcogenide glasses, superimposed on the expected Sf-RE PLE peaks. The results reviewed here demonstrate that the broad band PLE of the RE emission is due to the absorption of fight in the Urbach edge of the host glass followed by non-radiative transfer of the excitation energy to the RE emitters. On the basis of several unique properties of the broad band PLE, we suggest a model for the energy transfer process from the host glass to the REs mediated by intrinsic defect states in the glass. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:876 / 883
页数:8
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