The effect of electron pressure on suspended helium films

被引：13

作者：

Valkering, A ^{[1
]}

Klier, J ^{[1
]}

Leiderer, P ^{[1
]}

机构：

[1] Univ Konstanz, Fak Phys, D-78457 Constance, Germany

来源：

PHYSICA B | 2000年 / 284卷

关键词：

2D electrons; electron pressure; suspended helium films;

D O I：

10.1016/S0921-4526(99)02290-5

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

(Quasi-) one- and zero-dimensional electron systems can be created using a suspended helium film on a structured substrate. To investigate the relation between the curved surface and the properties of the electron system, the suspended helium film profile in a quasi-one-dimensional channel is measured interferometrically. It is shown that the film thickness decreases when the surface is charged with electrons at a density > 10(9) cm(-2). (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：172 / 173

页数：2

共 7 条

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