Electronic excitation in a catalytic support oxide, CeO2

被引：11
作者：
Mamontov, E
Dmowski, W
Egami, T
Kao, CC
机构：
[1] Univ Penn, Dept Mat Sci & Engn, Philadelphia, PA 19104 USA
[2] Univ Penn, Res Struct Matter Lab, Philadelphia, PA 19104 USA
[3] Brookhaven Natl Lab, Dept Phys, Upton, NY 11973 USA
来源：
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 2000年 / 61卷 / 03期
基金：
美国国家科学基金会;
关键词：
X-ray resonant Raman scattering;
D O I：
10.1016/S0022-3697(99)00331-5
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
X-ray resonant Raman scattering (XRRS) measurements were performed on a single crystal of ceria, CeO2, near the Ce Lm edge. Ceria is an important component of automotive catalytic converters, and helps to maintain the oxygen pressure in the vicinity of metal catalysts through the valence change Ce4+ <----> Ce3+. The XRRS spectra show rich features of electronic excitations in ceria involving various f state occupations of cerium that change with temperature and/or surface composition. Determining the electronic process that leads to valence change would facilitate the understanding of the buffering function of ceria. (C) 2000 Elsevier Science Ltd. All rights reserved.
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收藏
页码：431 / 433
页数：3
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