THz Measurement of Refractive Index and Thickness of Ceramic Coating on a Metal Substrate

被引：0
|
作者：
Fukuchi, T. [1 ]
Fuse, N. [1 ]
Mizuno, M. [2 ]
Fukunaga, K. [2 ]
机构：
[1] Cent Res Inst Elect Power Ind, 2-6-1 Nagasaka, Yokosuka, Kanagawa 2400196, Japan
[2] Natl Inst Informat & Commun Technol, Koganei, Tokyo 1848795, Japan
来源：
2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR) | 2013年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A method to obtain the refractive index and thickness of ceramic coating on a metal substrate by terahertz reflection measurement is presented. The measurement results are compared with the results of microscopic observation.
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页数：2
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