Physics analyses of an accelerator-driven sub-critical assembly

被引:7
作者
Naberezhnev, Dmitry G. [1 ]
Gohar, Yousry [1 ]
Bailey, James [1 ]
Belch, Henry [1 ]
机构
[1] Argonne Natl Lab, Nucl Engn Div, Argonne, IL 60439 USA
关键词
sub-critical assembly; external neutron source; electron accelerator; low-enrichment uranium; isotope production;
D O I
10.1016/j.nima.2006.02.068
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Physics analyses have been performed for an accelerator-driven sub-critical assembly as a part of the Argonne National Laboratory activity in preparation for a joint conceptual design with the Kharkov Institute of Physics and Technology (KIPT) of Ukraine. KIPT has a plan to construct an accelerator-driven sub-critical assembly targeted towards the medical isotope production and the support of the Ukraine nuclear industry. The external neutron source is produced either through photonuclear reactions in tungsten or uranium targets, or deuteron reactions in a beryllium target. KIPT intends using the high-enriched uranium (HEU) for the fuel of the sub-critical assembly. The main objective of this paper is to study the possibility of utilizing low-enriched uranium (LEU) fuel instead of HEU fuel without penalizing the sub-critical assembly performance, in particular the neutron flux level. In the course of this activity, several studies have been carried out to investigate the main choices for the system's parameters. The external neutron source has been characterized and a pre-conceptual target design has been developed. Several sub-critical configurations with different fuel enrichments and densities have been considered. Based on our analysis, it was shown that the performance of the LEU fuel is comparable with that of the HEU fuel. The LEU fuel sub-critical assembly with 200-MeV electron energy and 100-kW electron beam power has an average total flux of similar to 2.50 x 10(13) n/s cm(2) in the irradiation channels. The corresponding total facility power is similar to 204 kW divided into 91 and 113 kW deposited in the target and sub-critical assemblies, respectively. (c) 2006 Elsevier B.V. All rights reserved.
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页码:841 / 844
页数:4
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