High-resolution study of X-ray resonant raman scattering at the K edge of silicon

被引：31

作者：

Szlachetko, J. ^{[1
]}

Dousse, J. -Cl.

Hoszowska, J.

Pajek, M.

Barrett, R.

Berset, M.

Fennane, K.

Kubala-Kukus, A.

Szlachetko, M.

机构：

[1] Univ Fribourg, Dept Phys, CH-1700 Fribourg, Switzerland

[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[3] Jan Kochanowski Univ Humanities & Sci, Inst Phys, PL-25406 Kielce, Poland

来源：

PHYSICAL REVIEW LETTERS | 2006年 / 97卷 / 07期

关键词：

D O I：

10.1103/PhysRevLett.97.073001

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report on the first high-resolution measurements of the K x-ray resonant Raman scattering (RRS) in Si. The measured x-ray RRS spectra, interpreted using the Kramers-Heisenberg approach, revealed spectral features corresponding to electronic excitations to the conduction and valence bands in silicon. The total cross sections for the x-ray RRS at the 1s absorption edge and the 1s-3p excitation were derived. The Kramers-Heisenberg formalism was found to reproduce quite well the x-ray RRS spectra, which is of prime importance for applications of the total-reflection x-ray fluorescence technique.

引用

页数：4

共 21 条

[1]

Aberg T., 1985, ATOMIC INNER SHELL P, P419

[2] Aluminum impurities in silicon: Investigation of x-ray Raman scattering in total reflection x-ray fluorescence spectroscopy [J].

Baur, K ;

Kerner, J ;

Brennan, S ;

Singh, A ;

Pianetta, P .

JOURNAL OF APPLIED PHYSICS, 2000, 88 (08) :4642-4647

[3] Laboratory and synchrotron radiation total-reflection X-ray fluorescence: new perspectives in detection limits and data analysis [J].

Baur, K ;

Brennan, S ;

Burrow, B ;

Werho, D ;

Pianetta, P .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2001, 56 (11) :2049-2056

[4] MULTIPLE-SCATTERING EFFECTS IN THE K-EDGE X-RAY-ABSORPTION NEAR-EDGE STRUCTURE OF CRYSTALLINE AND AMORPHOUS-SILICON [J].

BIANCONI, A ;

DICICCO, A ;

PAVEL, NV ;

BENFATTO, M ;

MARCELLI, A ;

NATOLI, CR ;

PIANETTA, P ;

WOICIK, J .

PHYSICAL REVIEW B, 1987, 36 (12) :6426-6433

[5] Widths of the atomic K-N7 levels [J].

Campbell, JL ;

Papp, T .

ATOMIC DATA AND NUCLEAR DATA TABLES, 2001, 77 (01) :1-56

[6] X-ray transition energies: new approach to a comprehensive evaluation [J].

Deslattes, RD ;

Kessler, EG ;

Indelicato, P ;

de Billy, L ;

Lindroth, E ;

Anton, J .

REVIEWS OF MODERN PHYSICS, 2003, 75 (01) :35-99

[7] X-RAY RESONANT RAMAN-SCATTERING - OBSERVATION OF CHARACTERISTIC RADIATION NARROWER THAN LIFETIME WIDTH [J].

EISENBERGER, P ;

PLATZMAN, PM ;

WINICK, H .

PHYSICAL REVIEW LETTERS, 1976, 36 (11) :623-626

[8] Deconvolution of the lifetime broadening from x-ray absorption spectra of atomic and molecular species [J].

Filipponi, A .

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2000, 33 (15) :2835-2846

[9] ELECTRON CORRELATION IN SI STUDIED BY HIGH-RESOLUTION KLV AUGER-SPECTROSCOPY [J].

FOWLES, PS ;

EVANS, JA ;

LEE, PM ;

LAINE, AD ;

WEIGHTMAN, P .

PHYSICAL REVIEW B, 1993, 48 (19) :14142-14149

[10] COMPTON-SCATTERING BY K-SHELL ELECTRONS .1. NONRELATIVISTIC THEORY WITH RETARDATION [J].

GAVRILA, M .

PHYSICAL REVIEW A, 1972, 6 (04) :1348-&

← 1 2 3 →