Multiple Heat Source Thermal Modeling and Transient Analysis of LEDs

被引:20
作者
Alexeev, Anton [1 ]
Onushkin, Grigory [2 ]
Linnartz, Jean-Paul [1 ,2 ]
Martin, Genevieve [2 ]
机构
[1] Eindhoven Univ Technol, Dept Elect Engn, NL-5612 AZ Eindhoven, Netherlands
[2] Signify, Res, High Tech Campus 7, NL-5656 AE Eindhoven, Netherlands
基金
欧盟地平线“2020”;
关键词
dynamic thermal compact model; LED; silicone dome; phosphor light conversion; structure function; thermal transient analysis; thermal characterization; multiple heat source; secondary heat path; LIGHT-EMITTING-DIODES; CONDUCTIVITY; EXTRACTION; EFFICIENCY; RESISTANCES; COMPOSITES; MANAGEMENT; PHOSPHORS; DEVICES; PATH;
D O I
10.3390/en12101860
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Thermal transient testing is widely used for LED characterization, derivation of compact models, and calibration of 3D finite element models. The traditional analysis of transient thermal measurements yields a thermal model for a single heat source. However, it appears that secondary heat sources are typically present in LED packages and significantly limit the model's precision. In this paper, we reveal inaccuracies of thermal transient measurements interpretation associated with the secondary heat sources related to the light trapped in an optical encapsulant and phosphor light conversion losses. We show that both have a significant impact on the transient response for mid-power LED packages. We present a novel methodology of a derivation and calibration of thermal models for LEDs with multiple heat sources. It can be applied not only to monochromatic LEDs but particularly also to LEDs with phosphor light conversion. The methodology enables a separate characterization of the primary pn junction thermal power source and the secondary heat sources in an LED package.
引用
收藏
页数:28
相关论文
共 73 条
[1]  
Alexeev A, 2017, 2017 18TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME)
[2]   Multiple heat path dynamic thermal compact modeling for silicone encapsulated LEDs [J].
Alexeev, A. ;
Martin, G. ;
Onushkin, G. .
MICROELECTRONICS RELIABILITY, 2018, 87 :89-96
[3]  
Alexeev A., 2016, P 2016 17 INT C THER, P1
[4]  
Alexeev A., 2019, P SEM 35 SAN JOS CA
[5]  
Alexeev A, 2017, P IEEE SEMICOND THER, P283, DOI 10.1109/SEMI-THERM.2017.7896942
[6]  
Alexeev A, 2016, P IEEE SEMICOND THER, P33, DOI 10.1109/SEMI-THERM.2016.7458443
[7]  
[Anonymous], JESD5153
[8]  
[Anonymous], JESD5151
[9]  
[Anonymous], JESD5152
[10]  
[Anonymous], JESD5150