Measurement of X-ray absorption coefficient of NiCO3 around K-edge of Ni using synchrotron radiation

被引：0
|
作者：
Roy, Bunty Rani [1 ]
Rao, A. S. Nageswara [1 ]
机构：
[1] Kakatiya Univ, Dept Phys, Warangal 506009, Telangana State, India
来源：
MATERIALS TODAY-PROCEEDINGS | 2016年 / 3卷 / 10期
关键词：
absorption coefficient; synchrotron radiation; XAFS; MASS ATTENUATION COEFFICIENTS; PHOTOELECTRIC CROSS-SECTIONS; PHOTON ENERGIES; MIXTURE RULE; Z-ELEMENTS; TOMOGRAPHY; VALIDITY; TA; CR;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The work presents the X-ray absorption fine structure (XAFS) technique for measuring the X-ray absorption coefficient of NiCO3 in the X-ray energy range of 8271.2 to 8849.4 eV using scanning EXAFS beam line (BL-09) at Indus-2 synchrotron radiation source facility, Raja Ramanna Centre for Advanced Technology (RRCAT) at Indore, India. The result represents the absorption coefficient data for NiCO3 in the XAFS region of K-edge of Ni. However, the results are compared to theoretical predictions obtained from X-COM and FFAST methods. There is a maximum deviation which is found exactly near the K-edge jump and decreases as we move away from the absorption edge. (C) 2016 Elsevier Ltd. All rights reserved.
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页码：3861 / 3865
页数：5
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