Patterning on single crystalline silicon by laser scanning and alkaline etching

被引:4
作者
Hosono, Takashi [1 ]
Tokura, Hitoshi [1 ]
机构
[1] Tokyo Inst Technol, Dept Mech Sci & Engn, Meguro Ku, Tokyo 1528550, Japan
关键词
Laser processing; Surface patterning; KOH etching; Oxide layer;
D O I
10.1016/j.apsusc.2009.03.005
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The applicability of laser processing for small-lot micro-electromechanical system devices is discussed in this paper. This simple process could replace conventional complex processes designed with mass production in mind. Ablation, protrusions or surface modi. cation is revealed to occur by argon ion laser scanning into silicon. Which of them occurs depends on the laser power. It is found that the protrusions are covered by a thin layer of oxide; however, oxidation of the modified surface is not established even though some results suggest it. Surface modification is more applicable to surface patterning than coarse protrusion is because the laser-modified surface can be used as a mask in KOH etching to make sharp patterns. The applicability of this method is indicated by demonstrating pattern width control, patterning over a large area and the fabrication of a 16-bit linear scale. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:6857 / 6861
页数:5
相关论文
共 7 条
[1]   MODIFICATION OF HYDROGEN-PASSIVATED SILICON BY A SCANNING TUNNELING MICROSCOPE OPERATING IN AIR [J].
DAGATA, JA ;
SCHNEIR, J ;
HARARY, HH ;
EVANS, CJ ;
POSTEK, MT ;
BENNETT, J .
APPLIED PHYSICS LETTERS, 1990, 56 (20) :2001-2003
[2]   Etch stop of silicon surface induced by tribo-nanolithography [J].
Kawasegi, N ;
Morita, N ;
Yamada, S ;
Takano, N ;
Oyama, T ;
Ashida, K .
NANOTECHNOLOGY, 2005, 16 (08) :1411-1414
[3]  
KERN W, 1970, RCA REV, V31, P187
[4]   Fabrication of silicon utilizing mechanochemical local oxidation by diamond tip sliding [J].
Miyake, S ;
Kim, J .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2001, 40 (11B) :L1247-L1249
[5]   INFRARED-SPECTROSCOPY OF THIN SILICON DIOXIDE ON SILICON [J].
OLSEN, JE ;
SHIMURA, F .
APPLIED PHYSICS LETTERS, 1988, 53 (20) :1934-1936
[6]  
Senturia SD, 2003, BOSTON TRANSDUCERS'03: DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, P10
[7]  
WOLF AT, 1996, P 7 INT C DUR BUILD, V2, P139