Emission of ZnO:Ag nanorods obtained by ultrasonic spray pyrolysis

被引：24
作者：
Velazquez Lozada, E. [1 ]
Torchynska, T. V. [2 ]
Casas Espinola, J. L. [2 ]
Perez Milian, B. [3 ]
机构：
[1] ESIME Inst Politecn Nacl, Mexico City 07738, DF, Mexico
[2] ESFM Inst Politecn Nacl, Mexico City 07738, DF, Mexico
[3] UPIITA Inst Politecn Nacl, Mexico City 07738, DF, Mexico
来源：
PHYSICA B-CONDENSED MATTER | 2014年 / 453卷
关键词：
SEM; XRD; Photoluminescence; ZnO:Ag nanorods; Acceptor bound exciton; MOLECULAR-BEAM EPITAXY; GROWTH; PHOTOLUMINESCENCE; FILMS; LUMINESCENCE; EFFICIENCY; DEPENDENCE; DEPOSITION; AMBIENT; ARRAYS;
D O I：
10.1016/j.physb.2014.04.083
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Scanning electronic microscopy (SEM). X ray diffraction (XRD), photoluminescence (PL) and its temperature dependence have been studied in ZnO:Ag nanorods (NRs) prepared by the ultrasonic spray pyrolysis (USE) method. The time variation at the growth of ZnO:Ag films permits modifying the ZnO phase from the amorphous to crystalline, to change the size of ZnO:Ag NRs and to vary their emission spectra. PL spectra of ZnO:Ag NRs versus temperature has been investigated. This study reveals that the PL band related to the acceptor Ag-zn, (LO phonon replicas of an acceptor bound exciton, ABE (2.877 eV)), and its second-order diffraction peak (144 eV) disappeared in the temperature range of 10-170 K with the formation of free exciton (FX). The PL intensity of defect related PL bands decreases monotonously in the range 10-300 K with the activation energy of 13 meV. The PL band (3.22 eV), related to the LO phonon replica of free exciton (FX-2LO) and its second-order diffraction peak (1.61 eV) increase monotonously in the range 10-300 K. FX related peak dominates in PL spectra at room temperature that testifies on the high quality of ZnO:Ag films prepared by the USE technology. (C) 2014 Elsevier B.V. All rights reserved.
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页码：111 / 115
页数：5
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