A Comparative Study of Whole Issues and Challenges in Mutation Testing

被引:0
作者
Bokaei, Negar Nazem [1 ]
Keyvanpour, Mohammad Reza [1 ]
机构
[1] Alzahra Univ, Dept Comp Engn, Tehran, Iran
来源
2019 IEEE 5TH CONFERENCE ON KNOWLEDGE BASED ENGINEERING AND INNOVATION (KBEI 2019) | 2019年
关键词
mutation testing; software engineering; mutation testing challenges; MUTANT REDUCTION; GENERATION; SELECTION;
D O I
暂无
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Mutation testing is a powerful and expensive method in software testing context. It is used as a test criterion to assess the quality of test suites or generate test suites which are able to kill mutants created by seeding artificial defects in the original program code. These test suites are high-quality tests with good ability to find probable faults in the program under test. Mutation testing has gained high attention recently through its superiority over other testing criteria in different aspects and is the main topic of researches in software testing area. As well as powerfulness of mutation testing, it has challenges and difficulties which are great barriers for industrial utilization. This paper provides a comprehensive classification of mutation testing issues and challenges. Furthermore, a comparative study is conducted on researches that made an effort to investigate issues and resolve challenges of mutation testing along with presenting a classification of these proposed approaches. This comparative structure suggests different research topics and makes a guideline for researchers interested in mutation testing context. This also can be used for the purpose of comparing the existing methods, selecting the best one and improving selected methods.
引用
收藏
页码:745 / 754
页数:10
相关论文
共 52 条
  • [31] Offutt A. J., 2001, MUTATION TESTING NEW, P45
  • [32] Automated Test Case Generation as a Many-Objective Optimisation Problem with Dynamic Selection of the Targets
    Panichella, Annibale
    Kifetew, Fitsum Meshesha
    Tonella, Paolo
    [J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2018, 44 (02) : 122 - 158
  • [33] Papadakis M., 2014, S APPL COMP
  • [34] Papadakis M., 2010, 5 WORKSH AUT SOFTW T
  • [35] Metallaxis-FL: mutation-based fault localization
    Papadakis, Mike
    Le Traon, Yves
    [J]. SOFTWARE TESTING VERIFICATION & RELIABILITY, 2015, 25 (5-7) : 605 - 628
  • [36] Mutation based test case generation via a path selection strategy
    Papadakis, Mike
    Malevris, Nicos
    [J]. INFORMATION AND SOFTWARE TECHNOLOGY, 2012, 54 (09) : 915 - 932
  • [37] Papadakisa M., 2017, ADV COMPUTERS
  • [38] Parsai A., 2016, IEEE INT C SOFTW QUA
  • [39] Decreasing the cost of mutation testing with second-order mutants
    Polo, Macario
    Piattini, Mario
    Garcia-Rodriguez, Ignacio
    [J]. SOFTWARE TESTING VERIFICATION & RELIABILITY, 2009, 19 (02) : 111 - 131
  • [40] Reducing mutation costs through uncovered mutants
    Reales Mateo, Pedro
    Polo Usaola, Macario
    [J]. SOFTWARE TESTING VERIFICATION & RELIABILITY, 2015, 25 (5-7) : 464 - 489