Stabilization of an optical microscope to 0.1 nm in three dimensions

被引:111
作者
Carter, Ashley R. [1 ]
King, Gavin M.
Ulrich, Theresa A.
Halsey, Wayne
Alchenberger, David
Perkins, Thomas T.
机构
[1] Univ Colorado, Joint Inst Lab Astrophys, Boulder, CO 80309 USA
[2] NIST, Boulder, CO 80309 USA
[3] Univ Colorado, Dept Mol Cellular & Dev Biol, Boulder, CO 80309 USA
[4] Univ Colorado, Dept Phys, Boulder, CO 80309 USA
关键词
D O I
10.1364/AO.46.000421
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Mechanical drift is a long-standing problem in optical microscopy that occurs in all three dimensions. This drift increasingly limits the resolution of advanced surface-coupled, single-molecule experiments. We overcame this drift and achieved atomic-scale stabilization (0.1 nm) of an optical microscope in 3D. This was accomplished by measuring the position of a fiducial mark coupled to the microscope cover slip using back-focal-plane (BFP) detection and correcting for the drift using a piezoelectric stage. Several significant factors contributed to this experimental realization, including (i) dramatically reducing the low frequency noise in BFP detection, (ii) increasing the sensitivity of BFP detection to vertical motion, and (iii) fabricating a regular array of nanometer-sized fiducial marks that were firmly coupled to the cover slip. With these improvements, we achieved short-term (1 s) stabilities of 0.11, 0.10, and 0.09 nm (rms) and long-term (100 s) stabilities of 0.17, 0.12, and 0.35 nm (rms) in x, y, and z, respectively, as measured by an independent detection laser. (c) 2007 Optical Society of America
引用
收藏
页码:421 / 427
页数:7
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