Power dependent photoluminescence of ZnO

被引:24
作者
Cui, J. B. [1 ]
Thomas, M. A. [1 ]
机构
[1] Univ Arkansas, Dept Phys & Astron, Little Rock, AR 72204 USA
关键词
II-VI semiconductors; nanowires; photoluminescence; semiconductor thin films; spectral line breadth; spectral line shift; wide band gap semiconductors; zinc compounds; OPTICAL-PROPERTIES; ZINC-OXIDE; LUMINESCENCE; EMISSION; CENTERS; STATES;
D O I
10.1063/1.3194792
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of excitation power on the photoluminescence (PL) of three types of ZnO samples, including a polycrystalline pellet, thin film, and nanowires, was investigated. The intensity ratio of the defect to band edge emission as well as the overall spectral line shape of the defect emission was strongly affected by the excitation power. A blueshift of the defect emissions at high excitation powers was observed, indicating that donor-acceptor transitions are responsible for the defect emissions. The power dependent PL also suggests that comparisons of defect concentrations among ZnO samples may be possible only if the PL spectra are measured under the same excitation power.
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页数:5
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