HTS insert;
nuclear magnetic resonance (NMR);
screening current induced field (SCF);
TEMPERATURE;
DESIGN;
D O I:
10.1109/TASC.2009.2018102
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This paper presents experimental and simulation results of a screening current induced magnetic field (SCF) in a high temperature superconductor (HTS) insert that constitutes a low-/high-temperature superconductor (LTS/HTS) NMR magnet. In this experiment, the HTS insert, a stack of 50 double-pancake coils, each wound with Bi2223 tape, was operated at 77 K. A screening current was induced in the HTS insert by three magnetic field sources: 1) a self field from the HTS insert; 2) an external field from a 5-T background magnet; and 3) combinations of 1) and 2). For each field excitation, which induced an SCF, its axial field distribution and temporal variations were measured and compared with simulation results based on the critical state model. Agreement on field profile between experiment and simulation is satisfactory but more work is needed to make the simulation useful for designing shim coils that will cancel the SCF.
机构:
MIT, Magnet Technol Div, Francis Bitter Magnet Lab, Cambridge, MA 02139 USAMIT, Magnet Technol Div, Francis Bitter Magnet Lab, Cambridge, MA 02139 USA
Bascunan, Juan
Hahn, Seungyong
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机构:
MIT, Magnet Technol Div, Francis Bitter Magnet Lab, Cambridge, MA 02139 USAMIT, Magnet Technol Div, Francis Bitter Magnet Lab, Cambridge, MA 02139 USA
Hahn, Seungyong
Kim, Youngjae
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h-index: 0
机构:
MIT, Magnet Technol Div, Francis Bitter Magnet Lab, Cambridge, MA 02139 USAMIT, Magnet Technol Div, Francis Bitter Magnet Lab, Cambridge, MA 02139 USA
Kim, Youngjae
Song, Jungbin
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h-index: 0
机构:
MIT, Magnet Technol Div, Francis Bitter Magnet Lab, Cambridge, MA 02139 USAMIT, Magnet Technol Div, Francis Bitter Magnet Lab, Cambridge, MA 02139 USA
Song, Jungbin
Iwasa, Yukikazu
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h-index: 0
机构:
MIT, Magnet Technol Div, Francis Bitter Magnet Lab, Cambridge, MA 02139 USAMIT, Magnet Technol Div, Francis Bitter Magnet Lab, Cambridge, MA 02139 USA
机构:
MIT, Francis Bitter Magnet Lab, Magnet Technol Div, Cambridge, MA 02139 USAMIT, Francis Bitter Magnet Lab, Magnet Technol Div, Cambridge, MA 02139 USA
Bascunan, J.
Hahn, S.
论文数: 0引用数: 0
h-index: 0
机构:
MIT, Francis Bitter Magnet Lab, Magnet Technol Div, Cambridge, MA 02139 USAMIT, Francis Bitter Magnet Lab, Magnet Technol Div, Cambridge, MA 02139 USA
Hahn, S.
Kim, Y.
论文数: 0引用数: 0
h-index: 0
机构:
MIT, Francis Bitter Magnet Lab, Magnet Technol Div, Cambridge, MA 02139 USAMIT, Francis Bitter Magnet Lab, Magnet Technol Div, Cambridge, MA 02139 USA
Kim, Y.
Iwasa, Y.
论文数: 0引用数: 0
h-index: 0
机构:
MIT, Francis Bitter Magnet Lab, Magnet Technol Div, Cambridge, MA 02139 USAMIT, Francis Bitter Magnet Lab, Magnet Technol Div, Cambridge, MA 02139 USA