Noise characteristics of the gas ionization cascade used in low vacuum scanning electron microscopy

被引:5
作者
Tileli, Vasiliki [1 ]
Knowles, W. Ralph [2 ]
Toth, Milos [2 ]
Thiel, Bradley L. [1 ]
机构
[1] SUNY Albany, Coll Nanoscale Sci & Engn, Albany, NY 12203 USA
[2] FEI Co, Hillsboro, OR 97124 USA
关键词
noise; optimisation; scanning electron microscopy; MULTIPLICATION NOISE; IMAGE-ENHANCEMENT; AMPLIFICATION; SCATTERING; PHOTOMULTIPLIER; CONTRAST; SEM;
D O I
10.1063/1.3159883
中图分类号
O59 [应用物理学];
学科分类号
摘要
The noise characteristics of gas cascade amplified electron signals in low vacuum scanning electron microscopy (LVSEM) are described and analyzed. We derive expressions for each component contributing to the total noise culminating in a predictive, quantitative model that can be used for optimization of LVSEM operating parameters. Signal and noise behavior is characterized experimentally and used to validate the model. Under most operating conditions, the noise is dominated by the excess noise generated in the gas amplification cascade. At high gains, the excess noise increases proportionally with gain such that the signal-to-noise ratio is constant. The effects of several instrument operating parameters, including working distance, gas pressure, beam current, and detector bias, are condensed and presented in the form of a master curve.
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页数:8
相关论文
共 36 条
  • [1] *AG, 1303 AG
  • [2] Buckingham M.J., 1983, Noise in electronic devices and systems
  • [3] BUNDAY B, 2007, UNIFIED ADV CRITICAL
  • [4] Danilatos G.D., 1990, ADV ELECT ELECT PHYS, V78, P1, DOI DOI 10.1016/S0065-2539(08)60388-1
  • [5] DANILATOS GD, 1988, ADV ELECTRON EL PHYS, V71, P109
  • [6] AMPLIFICATION AND NOISE IN HIGH-PRESSURE SCANNING ELECTRON-MICROSCOPY
    DURKIN, R
    SHAH, JS
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1993, 169 : 33 - 51
  • [7] WIDE-BAND DETECTOR FOR MICRO-MICROAMPERE LOW-ENERGY ELECTRON CURRENTS
    EVERHART, TE
    THORNLEY, RFM
    [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1960, 37 (07): : 246 - 248
  • [8] PRIMARY CONSIDERATIONS FOR IMAGE-ENHANCEMENT IN HIGH-PRESSURE SCANNING ELECTRON-MICROSCOPY .1. ELECTRON-BEAM SCATTERING AND CONTRAST
    FARLEY, AN
    SHAH, JS
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1990, 158 : 379 - 388
  • [9] PRIMARY CONSIDERATIONS FOR IMAGE-ENHANCEMENT IN HIGH-PRESSURE SCANNING ELECTRON-MICROSCOPY .2. IMAGE-CONTRAST
    FARLEY, AN
    SHAH, JS
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1990, 158 : 389 - 401
  • [10] A THEORY OF MULTIPLICATION NOISE
    HOLLENHORST, JN
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1990, 37 (03) : 781 - 788