Design of fuze test system based on MCU and LabVIEW

被引：0

作者：

Hu, Zhipeng ^{[1
]}

Liu, Xingchun ^{[1
]}

机构：

[1] Beijing Univ Aeronaut & Astronaut, Sch Elect & Informat Engn, Beijing, Peoples R China

来源：

PROCEEDINGS OF 2014 IEEE WORKSHOP ON ADVANCED RESEARCH AND TECHNOLOGY IN INDUSTRY APPLICATIONS (WARTIA) | 2014年

关键词：

fuze; test; MCU; LabVIEW;

D O I：

暂无

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

A fuze test system based on MCU and LabVIEW is introduced for testing the fuze's working state. This system consist of the central controlling system based on C8051F020 and the host computer procedure based on LabVIEW. It can be used to test the static parameter and the dynamic signal of fuze. In condition, self- check and calibration are available. The host computer procedure can realize the automatic control, uploading, printing and saving. Both parts are connected by serial port. It has been proved that the system works correctly.

引用

页码：1333 / 1336

页数：4