Surface Characterization of Dispenser Cathodes at Operating Temperature and In-Situ Emission Measurements

被引：0

作者：

Roquais, Jean-Michel ^{[1
]}

机构：

[1] Thales Electron Devices, F-78141 Velizy Villacoublay, France

来源：

2014 TENTH INTERNATIONAL VACUUM ELECTRON SOURCES CONFERENCE (IVESC) | 2014年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A unique equipment has been developed to allow a complete characterization of thermionic cathodes in terms of surface chemistry at operating temperature and in-situ electronic emission. Auger spectroscopy is performed and coupled with cathode emission measurement in a close-spaced diode configuration. The relationship between chemistry and cathode emission will be discussed.

引用

页数：1