Use of quantitative X-ray diffraction for academic and industrial applications

被引：3
|
作者：
Mertens, Gilles [1 ]
Zeelmaekers, Edwin [1 ]
Machiels, Lieven [1 ]
机构：
[1] KULeuven, Dept Geol, Leuven, Belgium
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2006年 / 62卷
关键词：
quantitative X-ray powder diffraction; powder diffraction software; mineralogy;
D O I：
10.1107/S010876730609581X
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
m22.p07
引用
收藏
页码：S209 / S209
页数：1
相关论文
共 50 条
  • [21] Quantitative X-ray diffraction and X-ray fluorescence analyses of mixtures – unified and simplified
    Chung, Frank H. (fhchung1@gmail.com), 1600, Wiley-Blackwell, 5 Abbey Road, Chester, CH1 2HU, United Kingdom (51):
  • [22] DSC And X-Ray Diffraction CouplingSpecifications and applications
    G. Keller
    F. Lavigne
    L. Forte
    K. Andrieux
    M. Dahim
    C. Loisel
    M. Ollivon
    C. Bourgaux
    P. Lesieur
    Journal of Thermal Analysis and Calorimetry, 1998, 51 : 783 - 791
  • [23] Applications of X-Ray Diffraction in the Pharmaceutical Industry
    Fischer, Andreas
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2007, 63 : S52 - S52
  • [24] Multivariate Analysis Applications in X-ray Diffraction
    Guccione, Pietro
    Lopresti, Mattia
    Milanesio, Marco
    Caliandro, Rocco
    CRYSTALS, 2021, 11 (01) : 1 - 21
  • [25] Quantitative X-ray diffraction and X-ray fluorescence analyses of mixtures - unified and simplified
    Chung, Frank H.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2018, 51 : 789 - 795
  • [26] Industrial X-ray Diffraction Analysis of Building Materials
    Meier, Roger
    Anderson, Jennifer
    Verryn, Sabine
    APPLIED MINERALOLGY OF CEMENT & CONCRETE, 2012, 74 : 147 - 167
  • [27] Industrial aspects of synchrotron X-ray powder diffraction
    Radiat Phys Chem, 3 (445):
  • [28] Use of polycapillary X-ray lenses in the X-ray diffraction measurement of texture
    Welzel, U
    Leoni, M
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2002, 35 : 196 - 206
  • [29] ON-LINE X-RAY DIFFRACTION FOR QUANTITATIVE PHASE ANALYSIS: AN INDUSTRIAL APPLICATION OF THE RIETVELD METHOD
    Scarlett, N. V. Y.
    Madsen, I. C.
    Storer, P.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C243 - C243
  • [30] QUANTITATIVE DETERMINATION OF TALC AND TREMOLITE BY X-RAY DIFFRACTION
    NENADIC, CM
    CRABLE, JV
    AMERICAN INDUSTRIAL HYGIENE ASSOCIATION JOURNAL, 1969, 30 (02): : 144 - &
12345